可靠性测试3c认证公司的国际标准

Variable Frequency JESD22-B106 Resistance to Solder Shock for Through-Hole Mounted Devices JESD22-B110 Mechanical Shock - Compont and Subassembly JESD22-B111 Board Level Drop Test Method of Components for Handheld Electronic Products JESD22-B113 Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of Components for Handheld Electronic Products IPC/JEDEC J-STD-002 Solderability Test for Component Leads，， Terminals and Wires IPC/JEDEC J-STD-020 Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices ANSI/ESDA/JEDEC JS-001 Human Body Model (HBM) - Component Level ANSI/ESDA/JEDEC JS-002 Charged Device Model (CDM) – Device Level JEP122 Failure Mechanisms and Models for Semiconductor Devices JESD47 Stress-Test-Driven Qualification of Integrated Circuits JESD74 Early Life Failure Rate Calculation Procedure for Semiconductor Components JESD78 IC Latch-Up Test JESD226 RF BIASED LIFE (RFBL) TEST METHOD AEC STANDARDSDocument NumberContent AEC-Q100 Stress Qualification For Integrated Circuits (with test methods) AEC-Q101 Stress Test Qualification For Discrete Semiconductors AEC-Q200 Stress Test Qualification For Passive Components (complete document with test methods) AEC-Q005 Pb-Free Test Requirement AEC-Q006 Qualification Requirements for Components using Copper Wire Interconnections IEC STANDARDSDocument NumberContent IEC 60068 Environmental testing IEC 60747 Semiconductor devices IEC 60749 Semiconductor devices－Mechanical and climate test methods IEC 60810 Lamps for road vehicles – Performance requirements ， Terminations， Lugs， and Operating Life JESD22-A110 Highly-Accelerated Temperature and Humidity Stress Test (HAST) JESD22-A113 Preconditioning of Nonhermetic Surface Mount Devices prior to Reliability Testing JESD22-A115 Electrostatic Discharge (ESD) Sensitivity Testing Machine Model (MM) JESD22-A117 ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST JESD22-A118 Accelerated Moisture Resistance -Unbiased HAST JESD22-A119 Low Temperature Storage Life JESD22-B101 External Visual JESD22-B102 Solderability JESD22-B103 Vibration， JEDEC STANDARDSDocument NumberContent JESD22-A100 Cycled Temperature-Humidity-Bias Life Test JESD22-A101 Steady State Temperature Humidity Bias Life Test JESD22-A102 Accelerated Moisture Resistance - Unbiased Autoclave JESD22-A103 High Temperature Storage Life JESD22-A104 Temperature Cycling JESD22-A105 Power and Temperature Cycling JESD22-A106 Thermal Shock JESD22-A107 Salt Atmosphere JESD22-A108 Temperature， Bias，。